HEFBT from NEXPERIA >> Specification: Decade Counter, 30 MHz, 1 Gate, 1 Input, 3 V to 15 V, SOIC Technical Datasheet: HEFBT Datasheet. HEFBT, Nexperia Counter ICs 5-STAGE JOHNSON COUNTER datasheet, inventory, & pricing. HEFBT datasheet, HEFBT circuit, HEFBT data sheet: PHILIPS – 5 -stage Johnson counter,alldatasheet, datasheet, Datasheet search site for.
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Product [short] data sheet Production This document contains the product specification. In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail. Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice.
Limiting values — Stress above one or more limiting values as defined in the Absolute Maximum Ratings System of IEC may cause permanent damage to the device. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification.
Limiting values are stress ratings only and operation of the device at these or any other conditions above those given in the Characteristics datasheeet of this document is not implied.
In case of any inconsistency or conflict between information in this document and such terms and conditions, the latter will prevail. Recommended operating conditions Table 5.
Nexperia HEFBT, – PDF Datasheet – Series In Stock |
IEE logic symbol 6. Plastic or metal protrusions of 0. Rename the pins throughout to be consistent with rest of HEF family. When cascading counters, het4017bt Q output, which is LOW while the counter is in states 5, 6, 7, 8, and 9, can be used to drive the CP0 input of the next counter.
Static characteristics Table 6. Dynamic power dissipation PD PD can be calculated from the formulas shown. Limiting values Table 4. For more information, please fatasheet Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Decoded outputs are sequential within each stage and from stage to stage, with no dead time except propagation delay.
However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no dataxheet for the consequences of use of such information.
All referenced brands, product names, service names and trademarks are the property of their respective owners. Ordering information Table 1.
The latest product status information is available on the Internet at URL http: The content is still under internal review and subject to bef4017bt approval, which may result in modifications or additions. Revision history Table Schmitt trigger action makes the clock inputs highly tolerant of slower rise and fall times.
Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number s and title.
Test circuit Table Package SOT74 removed datzsheet Section 4. Exposure to limiting values for extended periods may affect device reliability.
Suitability for use — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property datasheeg environmental damage. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office.
Functional description Table 3. Automatic counter code correction is provided by an internal circuit: This document supersedes and replaces all information supplied prior to the publication hereof.
HEFBT, Datasheet (PDF Download) 5/18 Page – NXP Semiconductors
NXP Semiconductors does not give any vatasheet or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information.
Dynamic characteristics Table 7.
Applications — Ehf4017bt that are described herein for any of these products are for illustrative purposes only. Measurement points given in Table 9. Contact information For more information, please visit: Definitions for test circuit: A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information.
Terms and conditions of sale — NXP Semiconductors products are sold subject to the general terms daatsheet conditions of commercial sale, as published at http: