This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a. EIA/JEDEC standards and publications contain material that has been prepared, Within the JEDEC organization there are procedures whereby an EIA/JEDEC. additional reliability stress testing (i.e., JESD22 A and JESD47 or the semiconductor manufacturer’s in-house procedures). Passing the reject criteria in this.

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Standards & Documents Search

The symbol contained in this label, which may be used on the device itself, shows a hand in a triangle with a bar through it.

As such, it is recommended that assembly level testing be performed to determine if there are any adverse effects on that component due to its assembly to a PWB. This publication contains a set of frequently recommended and accepted JEDEC reliability stress tests. Stress 1 Apply Thermal. Terms, Definitions, and Symbols filter JC During the test, accelerated stress temperatures are used without electrical conditions applied. For technologies where there is adequate field failure data, alternative methods may be used to establish the early life failure rate.

It does not give pass or fail values or recommend specific test equipment, test structures or test algorithms. It establishes a set of data elements that describes the component and defines what each element means. This standard defines methods for calculating the early life failure rate of a product, using accelerated testing, whose failure rate is constant or decreasing over time. This standard will be useful to anyone engaged in handling semiconductor devices and integrated circuits that are subject to permanent damage due to electrostatic potentials.

The detailed use and application of burn-in is outside the scope of this document.


Thermally activated failure mechanisms are modeled using the Arrhenius Equation for acceleration. Learn more and apply today. The purpose of this standard is to define a procedure for performing measurement and calculation of early life failure rates.

Projections can be used to compare reliability performance with objectives, eua line feedback, support service cost estimates, and set product test and screen strategies to ensure that the ELFR meets customers’ requirements. Multiple Chip Packages JC This standard provides a method for determining solid state devices capability to withstand extreme temperature cycling.

Displaying 1 – 20 of 38 documents. Formerly known as EIA This standard is intended to describe specific stresses and failure mechanisms that are specific to compound semiconductors and power amplifier modules.

For each defined class of solid state drive, the standard defines the conditions of use and the corresponding endurance verification requirements. This kesd method, may be used by users to determine what classification level should be used for initial board level reliability qualification.

Assembly level testing may not be a prerequisite for device qualification; however, if the effect of assembly conditions on the component is not known, there could be reliability concerns for that component that are not evident in component level testing. This test is used to determine the effects of bias conditions and temperature on solid state devices over ea.

Standards & Documents Search | JEDEC

This standard is intended to identify a core set of qualification tests that apply specifically eiia Power 4 Modules and their primary application in mobile devices such as cellular phones. This document was written with the intent to provide information for quality organizations in both semiconductor companies and their customers to assess and make decisions on safe ESD level requirements.

This test is conducted to determine the ability of components eiw solder interconnects to withstand mechanical stresses induced by alternating high- and low-temperature extremes. This standard applies to single- dual- and triple-chamber temperature cycling and covers component and solder interconnection testing.


This fully revised test provides a means for determining the strength of gold and copper ball bonds to a jessd or package bonding jrsd, and may be performed on pre-encapsulation or post-encapsulation parts. Filter by document type: The document is organized in different sections to give as many technical details as possible to support the purpose given in the abstract.

It should be noted that this standard does not cover or apply to thermal shock chambers. This Test Method establishes an industry standard preconditioning flow for nonhermetic solid state SMDs surface mount devices that is representative of a typical industry multiple solder reflow operation. Search by Keyword or Document Number. A form of high temperature bias life using a short duration, popularly known as burn-in, may be used to screen for infant mortality related failures.

Show 5 10 20 results per page. Endurance and retention qualification specifications for cycle counts, durations, temperatures, and sample sizes are specified in JESD47 or may be developed using knowledge-based methods as in JESD The standard establishes a symbol and label that will gain the attention of those persons who might inflict electrostatic damage to the device. This standard describes a baseline set of acceptance tests for use in jeed electronic components as new products, a product family, or as products in a process which is being changed.

This document describes transistor-level test and data methods for the qualification of semiconductor technologies. This test method also provides a reliability preconditioning sequence for small SMDs that are eix soldered using full body immersion. Solid State Memories JC